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双面对准接触式紫外光刻机 |
Double Sided Mask Aligner System |
型 号:MA6
功 能:
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可用于Ⅲ-Ⅴ族易碎化合物、不规则碎片、透明基片的光刻 Applicable to fragile III-V compounds, thinned or warped wafers, transparent substrates, as well as pieces
主要指标:
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曝光波长(Wavelength):UV 400
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曝光面积(Effective exposure size):100 mm(4-inch)
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分辨率(Resolution):≤0.8 µm
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正面套刻精度(Top side alignment accuracy):≤ ±0.5 µm
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背面套刻精度(Bottom side alignment accuracy):≤ ±0.5 µm
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光强均匀度(Intensity Uniformity):≤±5% for 100 mm wafers
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曝光模式 (Printing modes):接近、硬接触、软接触和真空4种模式 (proximity,hard, soft and vacuum contact modes)
技术特点:
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双面对准,双面加工 Double sided mask alignment, and pattern printing on both sides of the substrate
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具有衍射减小光学系统,并可键合对准升级 Diffraction reducing exposure optics and a bond aligning option

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