论文

Influence of grain size at first monolayer on bias-stress effect in pentacene-based thin film transistors

论文编号:

作者:

Yiwei Zhang

刊物名称:

Appl. Phys. Lett.

所属学科:

论文题目英文:

Influence of grain size at first monolayer on bias-stress effect in pentacene-based thin film transistors

年:

2013

卷:

103

期:

21

页:

213304：1-4

联系作者:

Chao Jiang

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影响因子:

参与作者:

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