论文

Temperature-Dependent Gate Bias Stress Effect in Dioctylbenzothieno [2,3-b] benzothiophene-Based Thin-Film Transistor

论文编号:

作者:

Jiawei Wang

刊物名称:

IEEE TRANSACTIONS ON ELECTRON DEVICES

所属学科:

论文题目英文:

Temperature-Dependent Gate Bias Stress Effect in Dioctylbenzothieno [2,3-b] benzothiophene-Based Thin-Film Transistor

年:

2017

卷:

64

期:

页:

1723-1727

联系作者:

Chao Jiang

收录类别:

影响因子:

参与作者:

备注: